Title :
Test Pattern Generation for API Faults in RAM
Author :
Saluja, Kewal K. ; Kinoshita, Kozo
Author_Institution :
Department of Electrical and Computer Engineering, University of Newcastle
fDate :
3/1/1985 12:00:00 AM
Abstract :
In this correspondence we consider the problem of test pattern generation for random-access memory to detect pattern-sensitive faults. A test algorithm is presented which contains a near-optimal WRITE sequence and is an improvement over existing algorithms. The algorithm is well suited for built-in testing applications.
Keywords :
Built-in testing; fault detection; pattern-sensitive faults; random-access memory; static pattern-sensitive faults; Application software; Art; Australia; Fault detection; Hardware; Logic; Random access memory; Read-write memory; Test pattern generators; Testing; Built-in testing; fault detection; pattern-sensitive faults; random-access memory; static pattern-sensitive faults;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1985.1676572
