• DocumentCode
    1151994
  • Title

    Hybridization of FDTD and device behavioral-modeling techniques [interconnected digital I/O ports]

  • Author

    Grivet-Talocia, Stefano ; Stievano, Igor S. ; Canavero, Flavio G.

  • Author_Institution
    Dipt. di Elettronica, Politecnico di Torino, Italy
  • Volume
    45
  • Issue
    1
  • fYear
    2003
  • fDate
    2/1/2003 12:00:00 AM
  • Firstpage
    31
  • Lastpage
    42
  • Abstract
    We present a systematic methodology for the electromagnetic modeling of interconnected digital I/O ports. Digital drivers and receivers are represented through behavioral models based on radial basis functions expansions. Such a technique allows a very accurate representation of nonlinear/dynamic effects as well as switching behavior of real-world components by means of carefully identified discrete-time models. The inclusion of these models into a finite-difference time-domain solver for full-wave analysis of interconnected systems is presented. A rigorous stability analysis shows that use of nonlinear/dynamic discrete-time models can be easily integrated with standard full-wave solvers, even in the case of unmatched sampling time. A set of numerical examples illustrates the feasibility of this method.
  • Keywords
    computational electromagnetics; digital circuits; electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; modelling; numerical stability; transient analysis; EM modeling; EMC; FDTD techniques; device behavioral-modeling techniques; digital drivers; digital receivers; discrete-time models; electromagnetic compatibility; electromagnetic modeling; finite-difference time-domain solver; full-wave analysis; hybridization; interconnected digital I/O ports; interconnected systems; nonlinear circuits; nonlinear/dynamic effects; radial basis functions expansions; signal integrity; stability analysis; standard full-wave solvers; switching behavior; transient analysis; unmatched sampling time; Circuit simulation; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic modeling; Finite difference methods; Geometry; Integrated circuit interconnections; Interconnected systems; Stability analysis; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2002.808035
  • Filename
    1180391