DocumentCode :
1153078
Title :
Prolog to: Leakage current mechanisms and leakage reduction techniques in deep-submicrometer cmos circuits
Author :
Falk, Heiko
Volume :
91
Issue :
2
fYear :
2003
Firstpage :
303
Lastpage :
304
Keywords :
CMOS technology; Charge carrier processes; Circuits; Energy consumption; Leakage current; MOSFETs; Silicon; Subthreshold current; Threshold voltage; Tunneling;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2003.808154
Filename :
1182064
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1153078
