Title :
Linear Dependencies in Linear Feedback Shift Registers
Abstract :
Linear feedback shift registers have been proposed to generate test patterns for the self-test of logic networks. The probability of linear dependence among k bit positions of a subset of k bits in a maximum length shift register sequence is an outstanding problem. In this correspondence, we derive a formula for the calculation of the probability.
Keywords :
Linear feedback shift registers; self-test; test pattern generation; Automatic testing; Built-in self-test; Circuit testing; Linear feedback shift registers; Logic circuits; Logic testing; Polynomials; Shift registers; Test pattern generators; Very large scale integration; Linear feedback shift registers; self-test; test pattern generation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1986.1676718
