• DocumentCode
    1153877
  • Title

    Cryogenic performance of a CMOS 32-bit microprocessor subsystem built on the silicon-substrate-based multichip packaging technology

  • Author

    Lin, M.S. ; Paterson, A.S. ; Ghaffari, H.T.

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • Volume
    26
  • Issue
    14
  • fYear
    1990
  • fDate
    7/5/1990 12:00:00 AM
  • Firstpage
    1025
  • Lastpage
    1026
  • Abstract
    The performance improvement of a cryogenic CMOS 32-bit microprocessor subsystem built on the newly-developed silicon-substrate-based multichip packaging technology is reported. An 80-100% performance improvement is obtained when the supply voltage is between 4.00 and 5.25 V. The percentage of performance improvement begins increasing when the supply voltage is below 4 V. An approximately 140% performance improvement is observed at a supply voltage of 3.25 V. The percentage of performance improvement of a complicated, real subsystem operated at liquid nitrogen temperature depends on the supply voltage. A small size, high speed, high integration system, packaged on a silicon substrate and operated at liquid nitrogen temperature is possible.
  • Keywords
    CMOS integrated circuits; hybrid integrated circuits; microprocessor chips; packaging; silicon; substrates; 3.25 to 5.25 V; 32 bit; 77 K; CMOS 32-bit microprocessor subsystem; Si substrate; cryogenic performance; high integration system; liquid N 2 temperature; liquid nitrogen temperature; performance improvement; silicon-substrate-based multichip packaging technology; supply voltage;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19900664
  • Filename
    107994