DocumentCode :
1153978
Title :
Recognizing Noise-Influenced Power Quality Events With Integrated Feature Extraction and Neuro-Fuzzy Network
Author :
Liao, Chiung-Chou ; Yang, Hong-Tzer
Author_Institution :
Dept. of Electron. Eng., Ching Yun Univ., Jungli, Taiwan
Volume :
24
Issue :
4
fYear :
2009
Firstpage :
2132
Lastpage :
2141
Abstract :
The wavelet transform coefficients (WTCs) contain plenty of information needed for transient signal identification of power quality (PQ) events. However, once the power signals under investigation are corrupted by noises, the performance of the wavelet transform (WT) on detecting and recognizing PQ events would be greatly degraded. At the mean time, adopting the WTCs directly has the drawbacks of taking a longer time and much memory for the recognition system. To solve the problem of noises riding on power signals and to effectively reduce the number of features representing power transient signals, a noise-suppression scheme of noise-riding signals and an energy spectrum of the WTCs in different scales calculated by the Parseval´s theorem are presented in this paper. The neuro-fuzzy classification system is then used for fuzzy rule construction and signal recognition. The success rates of recognizing PQ events from noise-riding signals have proven to be feasible in power system applications.
Keywords :
fuzzy neural nets; fuzzy set theory; power engineering computing; power supply quality; power system identification; power system transient stability; signal denoising; wavelet transforms; Parseval theorem; energy spectrum; fuzzy rule construction; neuro-fuzzy classification system; noise-influenced power quality event recognition; noise-riding signal; noise-suppression scheme; power system application; power transient signal; signal recognition; transient signal identification; wavelet transform coefficient; Feature extraction; neuro-Fuzzy network; noise-suppression; power quality; wavelet transform;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/TPWRD.2009.2016789
Filename :
5175608
Link To Document :
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