DocumentCode
1154487
Title
Compact laser-diode sources for optical inspection probes
Author
Bachhuber, Mark R. ; Lorenz, Robert D.
Volume
25
Issue
4
fYear
1989
Firstpage
652
Lastpage
657
Abstract
The use of laser diode sources rather than conventional tube lasers to provide the illumination for many optical probe applications is considered. The technical issues addressed include temperature control, output intensity control, and collimation of the light output. Possible solutions, as well as experimental results from a laboratory optical probe developed using a laser diode source, are presented
Keywords
inspection; laser beam applications; probes; semiconductor junction lasers; collimation; illumination; laser diode sources; optical inspection probes; output intensity control; semiconductor junction lasers; temperature control; Diode lasers; Gas lasers; Head; Inspection; Laser beams; Lenses; Lighting; Optical sensors; Photodetectors; Probes;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/28.31242
Filename
31242
Link To Document