DocumentCode :
1156016
Title :
Dos and don´ts of technical writing
Author :
Morgan, Dennis
Volume :
24
Issue :
3
fYear :
2005
Firstpage :
22
Lastpage :
25
Keywords :
Back; Biomedical engineering; Bit error rate; Difference equations; Displays; Multiaccess communication; Production; Robustness; Text processing; Writing;
fLanguage :
English
Journal_Title :
Potentials, IEEE
Publisher :
ieee
ISSN :
0278-6648
Type :
jour
DOI :
10.1109/MP.2005.1502501
Filename :
1502501
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1156016
