Title :
Laser Simulation of SEE Due to Localized Ionization in Dielectric Structures
Author :
Chugg, Andrew M. ; English, Roger ; Parker, Sarah ; Burnell, Andrew J.
Author_Institution :
MBDA UK Ltd., Bristol
Abstract :
This paper reports an investigation of the use of two-photon absorption (TPA) of blue laser pulses and production of ultraviolet pulses through second harmonic generation (SHG) to simulate single event effects involving ionization and charge trapping in dielectrics.
Keywords :
dielectric materials; laser beams; microchip lasers; optical harmonic generation; photoionisation; two-photon processes; blue laser pulses; charge trapping; laser simulation; localized ionization; microchip dielectric structures; second harmonic generation; single event effects; two-photon absorption; ultraviolet pulse production; Dielectrics; Electromagnetic wave absorption; Ionization; Laser transitions; Microchip lasers; Optical harmonic generation; Optical pulse generation; Optical pulses; Pulse amplifiers; Testing; Ionization; lasers; single event effects; ultraviolet radiation effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2009450
