DocumentCode :
1157213
Title :
Effect of Electron Traps on Scintillation of Praseodymium Activated Lu _3 Al _5 O
Author :
Drozdowski, W. ; Dorenbos, P. ; Drozdowska, R. ; Bos, A.J.J. ; Poolton, N.R.J. ; Tonelli, M. ; Alshourbagy, M.
Author_Institution :
Fac. of Appl. Sci., Delft Univ. of Technol., Delft
Volume :
56
Issue :
1
fYear :
2009
Firstpage :
320
Lastpage :
327
Abstract :
In this paper we present the studies performed on a set of Lu3Al5O12:Pr (LuAG:Pr) crystals with praseodymium concentration between 1.5 and 10%, grown by the micro-pulling-down (muPD) technique. The research comprises the measurements of X-ray excited emission spectra and 137Cs gamma-ray pulse height spectra in a range from 78 to 600 K, and thermoluminescence glow curves. Based on experimental data we discuss the dependence of scintillation properties of Lu3Al5O12:Pr on praseodymium content and temperature. The main attention is focused on a distinct increase of scintillation yield with temperature, which we attribute to existence of shallow electron traps and their temperature-dependent contribution to scintillation of LuAG:Pr. An active role of traps is demonstrated by a novel experiment combining X-ray and laser excitation.
Keywords :
X-ray emission spectra; electron traps; gamma-ray spectra; lutetium compounds; praseodymium; solid scintillation detectors; thermoluminescence; 137Cs gamma-ray pulse height spectra; Lu3Al5O12:Pr; LuAG:Pr crystals; X-ray excited emission spectra; electron trap effect; ionizing radiation detectors; laser excitation; micropulling-down technique; praseodymium concentration; scintillation properties; temperature 78 K to 600 K; temperature-dependency; thermoluminescence glow curves; Charge carrier processes; Crystalline materials; Crystals; Electron traps; Laser excitation; Laser theory; Physics; Pulse measurements; Temperature dependence; X-ray lasers; LuAG:Pr; light yield; scintillation mechanism; trap;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.2011269
Filename :
4782174
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