Title :
An enhanced-performance CMOS imager with a flushed-reset photodiode pixel
Author :
Pain, Bedabrata ; Yang, Guang ; Cunningham, Thomas J. ; Wrigley, Chris ; Hancock, Bruce
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
1/1/2003 12:00:00 AM
Abstract :
A new front-end for photodiode-based CMOS imagers is presented. Degradation in imaging performance due to conventional hard- and soft-reset of pixels is analyzed. To overcome these limitations, the design and operation of a flushed-reset pixel is described. The flushed-reset pixel combines the best of hard- and soft-reset to simultaneously provide excellent radiometric accuracy, high linearity, no image lag, high saturation level, and reduced read-noise. The new front-end is implemented by changes to the column-circuitry only, leaving the pixel unchanged, preventing degradation of any unrelated imaging performance. It is compatible with large format imager implementation, has minimal impact on the frame-rate, and does not introduce any additional hot-carrier stress in the pixel. Data from a large format (5122) imager demonstrates the efficacy of the flushed-reset pixel approach.
Keywords :
CMOS image sensors; hot carriers; integrated circuit noise; photodiodes; CMOS imager; column-circuitry; flushed-reset photodiode pixel; hot-carrier stress; large format imager; linearity; radiometric accuracy; read-noise; saturation level; soft-reset; Circuit testing; Degradation; Diodes; FETs; Linearity; Noise level; Noise reduction; Photodiodes; Pixel; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2002.806969