• DocumentCode
    1159934
  • Title

    Physics-Based Analysis and Simulation of Phase Noise in Oscillators

  • Author

    Hong, Sung-Min ; Park, Chan Hyeong ; Min, Hong Shick ; Park, Young June

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ.
  • Volume
    53
  • Issue
    9
  • fYear
    2006
  • Firstpage
    2195
  • Lastpage
    2201
  • Abstract
    A technology computer-aided design framework that can predict the phase noise spectrum of an oscillator using nonlinear perturbation analysis is developed. The device-circuit mixed-mode simulation technique based upon the shooting-Newton method is exploited to evaluate the periodic steady-state solution of the oscillator. The influence of noise sources inside the devices on the phase deviation is calculated in an efficient and accurate way using the perturbation projection vector. The period jitter and the output power spectrum can be easily obtained in this framework. As an application, the output power spectrum of a CMOS LC voltage-controlled oscillator is calculated
  • Keywords
    CMOS integrated circuits; Newton method; circuit CAD; circuit simulation; mixed analogue-digital integrated circuits; nonlinear network analysis; perturbation techniques; phase noise; voltage-controlled oscillators; CMOS LC; computer aided design; device circuit mixed mode simulation; nonlinear perturbation analysis; output power spectrum; period jitter; periodic steady state solution; perturbation projection vector; phase deviation; phase noise; physics based analysis; shooting Newton method; voltage controlled oscillator; Analytical models; Computational modeling; Design automation; Jitter; Phase noise; Power generation; Power system harmonics; Semiconductor device noise; Steady-state; Voltage-controlled oscillators; Mixed-mode simulation; oscillator; phase noise; semiconductor device modeling; semiconductor device noise;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.880166
  • Filename
    1677853