• DocumentCode
    1161112
  • Title

    Edit disfluency detection and correction using a cleanup language model and an alignment model

  • Author

    Yeh, Jui-Feng ; Wu, Chung-Hsien

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan
  • Volume
    14
  • Issue
    5
  • fYear
    2006
  • Firstpage
    1574
  • Lastpage
    1583
  • Abstract
    This investigation presents a novel approach to detecting and correcting the edit disfluency in spontaneous speech. Hypothesis testing using acoustic features is first adopted to detect potential interruption points (IPs) in the input speech. The word order of the cleanup utterance is then cleaned up based on the potential IPs using a class-based cleanup language model, the deletable region and the correction are aligned using an alignment model. Finally, log linear weighting is applied to optimize the performance. Using the acoustic features, the IP detection rate is significantly improved especially in recall rate. Based on the positions of the potential IPs, the cleanup language model and the alignment model are able to detect and correct the edit disfluency efficiently. Experimental results demonstrate that the proposed approach has achieved error rates of 0.33 and 0.21 for IP detection and edit word deletion, respectively
  • Keywords
    error statistics; speech recognition; alignment model; class-based cleanup language model; cleanup utterance; deletable region; edit disfluency correction; edit disfluency detection; edit word deletion; error rates; hypothesis testing; interruption point detection; log linear weighting; spontaneous speech; Acoustic signal detection; Acoustic testing; Automatic speech recognition; Computer vision; Error analysis; Humans; Loudspeakers; Natural languages; Speech analysis; Speech recognition; Edit disfluency; language model; potential interruption point (IP) detection; rich transcription;
  • fLanguage
    English
  • Journal_Title
    Audio, Speech, and Language Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1558-7916
  • Type

    jour

  • DOI
    10.1109/TASL.2006.878267
  • Filename
    1677978