• DocumentCode
    1161428
  • Title

    Surface-mount attachment reliability of clip-leaded ceramic chip carriers on FR-4 circuit boards

  • Author

    Engelmaier, Werner ; Attarwala, Abbas I.

  • Author_Institution
    AT&T Bell Lab., Whippany, NJ, USA
  • Volume
    12
  • Issue
    2
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    284
  • Lastpage
    296
  • Abstract
    The reliability of the attachment of 100 I/O ceramic chip carriers (CCs) surface mounted to FR-4 epoxy/glass circuit boards using clip-leads has been investigated. Clip-leads, commercially available from two vendors, of significantly different designs were utilized. The accelerated tests involved the accurate reproduction of the thermal and physical conditions-internal cyclic power dissipation, external thermal cycling of forced air stream, thermal gradients, mounting hardware, etc.-encountered by the product in use. The test acceleration (by acceleration factors between 12 and 20 for mean time to failure) was accomplished with shorter dwell times at the temperature extremes, resulting in 96 accelerated fatigue cycles per day. The distinct difference in lead compliancy between the two clip-lead designs is clearly reflected in the results of the accelerated reliability tests. The Type-A `J-lead design´ clip-lead (K=58 lb/in) CCs showed a median life to failure of 12000 cycles, while the Type-B `hinged S-bend design´ clip-lead (K=7.5 lb/in) CCs exhibited no failures when the test was terminated at 100000 cycles. Failure mode analysis shows that all Type-A clip-lead solder joints have failed after 48000 accelerated cycles due to the CC/substrate expansion mismatch: at 100000 accelerated cycles a significant number of clip joints showed cracks due to the solder/ceramic CC material expansion differential
  • Keywords
    environmental testing; failure analysis; life testing; printed circuit manufacture; reliability; surface mount technology; FR-4 circuit boards; J-lead design; SMT; accelerated fatigue cycles; accelerated reliability tests; accelerated tests; clip-lead designs; clip-leaded ceramic chip carriers; different designs; epoxy/glass circuit boards; expansion mismatch; external thermal cycling; failure analysis; forced air stream; hinged S-bend lead design; internal cyclic power dissipation; lead compliancy; mean time to failure; mounting hardware; surface mount attachment; thermal gradients; Acceleration; Carbon capture and storage; Ceramics; Circuit testing; Glass; Hardware; Life estimation; Power dissipation; Printed circuits; Thermal force;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.31435
  • Filename
    31435