• DocumentCode
    1161443
  • Title

    Calculation of electrical parameters of a thin-film multichip package

  • Author

    Nayak, Deepak ; Hwang, Lih-Tyng ; Turlik, Iwona

  • Author_Institution
    Microelectron. Center of North Carolina, Research Triangle Park, NC, USA
  • Volume
    12
  • Issue
    2
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    303
  • Lastpage
    309
  • Abstract
    The calculations of the electrical parameters of a thin-film multichip package are presented. It is shown that a commonly used 2-D device simulator, PISCES, can be used to compute the electrical parameters of the thin-film lines up to a frequency where the skin effect is important. For trapezoidal conductor cross-sections, it is shown that the maximum variations of self- and mutual (coupling) capacitances are within 10% of their corresponding rectangular values when the sidewall angle of the conductor is varied up to 30°, and the line cross-section area is kept constant. For the case when the conductor base is kept constant, the variation in mutual capacitance is found to be within 30% and that for self-capacitance is found to be within 12% when the sidewall angle is varied up to 30°. A simple R-L-C circuit is used to represent a three-conductor lossy transmission line system, and SPICE is used to analyze the responses in the time domain. A thin-film multichip package design is briefly outlined. A HP-8510 network analyzer is used to verify the simulation results
  • Keywords
    circuit analysis computing; hybrid integrated circuits; strip line components; thin film circuits; transmission line theory; 2-D device simulator; PISCES; R-L-C circuit; SPICE; calculations; electrical parameters; line cross-section area; mutual capacitance; self-capacitance; simulation results; skin effect; thin-film multichip package; three-conductor lossy transmission line system; time domain; trapezoidal conductor cross-sections; Capacitance; Circuits; Computational modeling; Conductors; Frequency; Mutual coupling; Packaging; Skin effect; Thin film devices; Transistors;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.31437
  • Filename
    31437