• DocumentCode
    1161820
  • Title

    An algorithmic approach to fault diagnosis in linear systems

  • Author

    Kim, Jee Hong ; Bien, Zeungnam

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
  • Volume
    36
  • Issue
    3
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    313
  • Lastpage
    320
  • Abstract
    An algorithmic approach for multiple fault diagnosis of linear discrete-time systems is proposed. Based on notions of an expected deviation vector and variation factors, it is shown that t faults in functional units of a dynamic system can be diagnosed with t+1 sample times. The method is considered efficient when the number of faults is unknown but small and when the sampling period is lengthy, as in chemical process with large time constants. Its effectiveness is illustrated by simulated examples
  • Keywords
    discrete time systems; fault location; linear systems; chemical process; dynamic system; fault diagnosis; linear discrete-time systems; linear systems; Chemical processes; Dictionaries; Fault detection; Fault diagnosis; Linear systems; Parameter estimation; Production systems; Redundancy; Sampling methods; Vectors;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/41.31493
  • Filename
    31493