DocumentCode
1161820
Title
An algorithmic approach to fault diagnosis in linear systems
Author
Kim, Jee Hong ; Bien, Zeungnam
Author_Institution
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
Volume
36
Issue
3
fYear
1989
fDate
8/1/1989 12:00:00 AM
Firstpage
313
Lastpage
320
Abstract
An algorithmic approach for multiple fault diagnosis of linear discrete-time systems is proposed. Based on notions of an expected deviation vector and variation factors, it is shown that t faults in functional units of a dynamic system can be diagnosed with t +1 sample times. The method is considered efficient when the number of faults is unknown but small and when the sampling period is lengthy, as in chemical process with large time constants. Its effectiveness is illustrated by simulated examples
Keywords
discrete time systems; fault location; linear systems; chemical process; dynamic system; fault diagnosis; linear discrete-time systems; linear systems; Chemical processes; Dictionaries; Fault detection; Fault diagnosis; Linear systems; Parameter estimation; Production systems; Redundancy; Sampling methods; Vectors;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/41.31493
Filename
31493
Link To Document