Title :
Analysis of crosstalk interference in CMOS integrated circuits
Author :
Sicard, Etienne ; Rubio, Antonio
Author_Institution :
Dept. of Electr. Eng., INSA-DGE, Toulouse, France
fDate :
5/1/1992 12:00:00 AM
Abstract :
The authors show how crosstalk coupling between transmission lines inside CMOS integrated circuits can provoke faulty behavior by affecting the propagation delay of the logic and analog cells. A simplified model for the evaluation of parasitic capacitive coupling effects is proposed, and the influence of crosstalk on the behavior of basic functions such as logic gates, latches, RAM memory, and analog-to-digital converters is evaluated
Keywords :
CMOS integrated circuits; analogue-digital conversion; crosstalk; delays; integrated logic circuits; random-access storage; ADC; CMOS integrated circuits; RAM; analog cells; analog-to-digital converters; crosstalk interference; latches; logic cells; logic gates; parasitic capacitive coupling; propagation delay; transmission lines; CMOS integrated circuits; CMOS logic circuits; Circuit faults; Coupling circuits; Crosstalk; Distributed parameter circuits; Interference; Logic gates; Propagation delay; Semiconductor device modeling;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
