DocumentCode
1162041
Title
Numerical modeling of nonplanar oxidation coupled with stress effects
Author
Umimoto, Hiroyuki ; Odanaka, Shinji ; Nakao, Ichiro ; Esaki, Hideya
Author_Institution
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Volume
8
Issue
6
fYear
1989
fDate
6/1/1989 12:00:00 AM
Firstpage
599
Lastpage
607
Abstract
The study focuses on the numerical solution method based on a finite-difference approach with the coordinate transformation method for simulating the nonplanar oxide growth. A relaxation technique is introduced to incorporate the stress effect into oxidation kinetic equations maintaining numerical stability. In addition, for simulating the stress-dependent oxide growth, the role of the boundary condition at the free-oxide surface is discussed. The present method allows an accurate evaluation of the local stress distribution in nonplanar oxide structures and realizes the precise simulation of oxide shapes under the large stress effect. They are demonstrated in applications to both the LOCOS process with thick nitride film and the trench oxidation process, which strongly depends on the oxidation-induced stress at trench corners
Keywords
difference equations; integrated circuit technology; oxidation; relaxation theory; semiconductor device models; stress effects; LOCOS process; boundary condition; coordinate transformation method; finite-difference approach; free-oxide surface; local stress distribution; modeling; monolithic IC; nonplanar oxidation; nonplanar oxide structures; numerical solution method; numerical stability; oxidation kinetic equations; relaxation technique; semiconductor devices; simulation; stress effects; stress-dependent oxide growth; thick nitride film; trench oxidation process; Boundary conditions; Deformable models; Equations; Finite difference methods; Kinetic theory; Numerical models; Oxidation; Predictive models; Shape; Stress;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.31516
Filename
31516
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