• DocumentCode
    1162041
  • Title

    Numerical modeling of nonplanar oxidation coupled with stress effects

  • Author

    Umimoto, Hiroyuki ; Odanaka, Shinji ; Nakao, Ichiro ; Esaki, Hideya

  • Author_Institution
    Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
  • Volume
    8
  • Issue
    6
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    599
  • Lastpage
    607
  • Abstract
    The study focuses on the numerical solution method based on a finite-difference approach with the coordinate transformation method for simulating the nonplanar oxide growth. A relaxation technique is introduced to incorporate the stress effect into oxidation kinetic equations maintaining numerical stability. In addition, for simulating the stress-dependent oxide growth, the role of the boundary condition at the free-oxide surface is discussed. The present method allows an accurate evaluation of the local stress distribution in nonplanar oxide structures and realizes the precise simulation of oxide shapes under the large stress effect. They are demonstrated in applications to both the LOCOS process with thick nitride film and the trench oxidation process, which strongly depends on the oxidation-induced stress at trench corners
  • Keywords
    difference equations; integrated circuit technology; oxidation; relaxation theory; semiconductor device models; stress effects; LOCOS process; boundary condition; coordinate transformation method; finite-difference approach; free-oxide surface; local stress distribution; modeling; monolithic IC; nonplanar oxidation; nonplanar oxide structures; numerical solution method; numerical stability; oxidation kinetic equations; relaxation technique; semiconductor devices; simulation; stress effects; stress-dependent oxide growth; thick nitride film; trench oxidation process; Boundary conditions; Deformable models; Equations; Finite difference methods; Kinetic theory; Numerical models; Oxidation; Predictive models; Shape; Stress;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.31516
  • Filename
    31516