DocumentCode
116285
Title
Aggregation of Markov chains: an analysis of deterministic annealing based methods
Author
Yunwen Xu ; Beck, Carolyn L. ; Salapaka, Srinivasa M.
Author_Institution
Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2014
fDate
15-17 Dec. 2014
Firstpage
6591
Lastpage
6596
Abstract
We develop a method for aggregating large Markov chains into smaller representative Markov chains, where Markov chains are viewed as weighted directed graphs, and similar nodes (and edges) are aggregated using a deterministic annealing approach. The notions of representativeness of the aggregated graphs and similarity between nodes in graphs are based on a newly proposed metric that quantifies connectivity in the underlying graph. Namely, we develop notions of distance between subchains in Markov chains, and provide easily verifiable conditions that determine if a given Markov chain is nearly decomposable, that is, conditions for which the deterministic annealing approach can be used to identify subchains with high probability. We show that the aggregated Markov chain preserves certain dynamics of the original chain. In particular we provide explicit bounds on the ℓ1 norm of the error between the aggregated stationary distribution of the original Markov chain and the stationary distribution of the aggregated Markov chain, which extends on longstanding foundational results (Simon and Ando, 1961).
Keywords
Markov processes; deterministic algorithms; directed graphs; optimisation; statistical distributions; ℓ1 norm; aggregated Markov chain stationary distribution aggregation; aggregated graphs; deterministic annealing based methods; distance notion development; original Markov chain stationary distribution aggregation; similar node aggregation; similarity; subchain identification; weighted directed graphs; Annealing; Biological system modeling; Eigenvalues and eigenfunctions; Indexes; Markov processes; Matrix decomposition; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control (CDC), 2014 IEEE 53rd Annual Conference on
Conference_Location
Los Angeles, CA
Print_ISBN
978-1-4799-7746-8
Type
conf
DOI
10.1109/CDC.2014.7040423
Filename
7040423
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