• DocumentCode
    1163068
  • Title

    MOS2: an efficient MOnte Carlo Simulator for MOS devices

  • Author

    Sangiorgi, Enrico ; Riccó, Bruno ; Venturi, Franco

  • Author_Institution
    Dept. of Electron., Bologna Univ., Italy
  • Volume
    7
  • Issue
    2
  • fYear
    1988
  • fDate
    2/1/1988 12:00:00 AM
  • Firstpage
    259
  • Lastpage
    271
  • Abstract
    An efficient Monte Carlo device simulator has been developed as a postprocessor of a two-dimensional numerical analyzer based on the drift-diffusion model. The Monte Carlo package analyzes real VLSI MOSFETs in a minicomputer environment, overcoming some existing theoretical and practical problems. In particular, the particle free-flight time distribution is obtained by a new algorithm, leading to a CPU time saving of at least one order of magnitude compared with the traditional approach. To describe rare electron configurations, such as the high-energy tails of the distributions and the particle dynamics in the presence of large retarding fields, a multiple repetition scheme was implemented. Selected applications are presented to illustrate the simulator´s capabilities
  • Keywords
    Monte Carlo methods; electronic engineering computing; insulated gate field effect transistors; metal-insulator-semiconductor devices; semiconductor device models; MOS devices; MOS2; Monte Carlo device simulator; VLSI MOSFETs; drift-diffusion model; minicomputer environment; multiple repetition scheme; particle free-flight time distribution; rare electron configurations; two-dimensional numerical analyzer; Acoustic scattering; Analytical models; Charge carrier density; Electrons; Impurities; MOS devices; MOSFETs; Microcomputers; Monte Carlo methods; Optical scattering; Packaging; Particle scattering; Phonons; Probability distribution; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.3157
  • Filename
    3157