• DocumentCode
    1163071
  • Title

    Embedded boundary scan

  • Author

    Van Treuren, Bradford G. ; Miranda, Jose M.

  • Author_Institution
    Test Solutions Group, Lucent Technol., Holmdel, NJ, USA
  • Volume
    20
  • Issue
    2
  • fYear
    2003
  • Firstpage
    20
  • Lastpage
    25
  • Abstract
    As boundary scan technology continues to mature, engineers continue to find innovative ways of using the IEEE Std. 1149.1 facilities throughout the life cycle of a board. Lucent Technologies is at the forefront of this development, and the authors here describe how they have expanded the use and reuse of the IEEE 1149.1 board tests into a variety of additional test environments.
  • Keywords
    boundary scan testing; logic testing; IEEE 1149.1 board tests; boundary scan technology; boundary scan tests; hardware modules; life cycle; test environments; Application specific processors; Automatic testing; Control systems; Embedded software; Joining processes; LAN interconnection; Pins; Software standards; Software testing; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1188258
  • Filename
    1188258
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1163071