• DocumentCode
    1163080
  • Title

    Electromagnetic signatures as a tool for connectionless test

  • Author

    Salamati, Mahnaz ; Stranneby, Dag

  • Author_Institution
    Electron. Production Eng. Res. Group, Orebro Univ., Sweden
  • Volume
    20
  • Issue
    2
  • fYear
    2003
  • Firstpage
    26
  • Lastpage
    30
  • Abstract
    When we test boards, we usually think in terms of traditional electrical test (in-circuit, flying probe) and nonelectrical test (optical, x-ray). This Orebro University article develops an alternative, connectionless technique based on scanning the electromagnetic field generated by active on-board devices. Could this make it into industry as an additional diagnostic tool?.
  • Keywords
    circuit testing; logic testing; Orebro University; UUT; analog circuitry; built-in self-test; connectionless technique; connectionless test; diagnostic tool; electromagnetic field measurements; functional testing; spectral analysis; troubleshoot; unit under test; Current measurement; Electromagnetic fields; Electromagnetic measurements; Feature extraction; Frequency; Performance evaluation; Probes; Signal processing; Spatial databases; Testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1188259
  • Filename
    1188259