• DocumentCode
    1163662
  • Title

    CMOS readout circuit allowing microbolometer arrays to operate without temperature stabilisation

  • Author

    Kang, S.G. ; Lee, Y.S. ; Lee, H.C.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., KAIST, Daejeon, South Korea
  • Volume
    40
  • Issue
    23
  • fYear
    2004
  • Firstpage
    1459
  • Lastpage
    1460
  • Abstract
    A new CMOS readout circuit that controls the non-uniformity of microbolometer arrays as a function of operating temperature change is described. This circuit provides a nonlinear bias current for operating temperature using a MOS transistor that is operated in the subthreshold region. This approach allows microbolometer arrays to operate without temperature stabilisation up to an operating temperature change of approximately 40K.
  • Keywords
    CMOS integrated circuits; MOSFET; bolometers; infrared detectors; readout electronics; 40 K; CMOS readout circuit; MOS transistor; microbolometer arrays; nonlinear bias current; nonuniformity calibration method; operating temperature change; temperature stabilisation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20046830
  • Filename
    1358931
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1163662