• DocumentCode
    1165170
  • Title

    Conference Reports

  • Author

    Novak, O. ; Kubatova, Hana ; Al-Hashimi, B.M. ; Marinissen, Erik Jan ; Ravikumar, C.P.

  • Volume
    23
  • Issue
    4
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    262
  • Lastpage
    265
  • Abstract
    Reports from Workshop on System Effects of Logic Soft Errors (SELSE II), IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop (DDECS 06), European Test Symposium (ETS 06), and International Test Conference (ITC 05).
  • Keywords
    Logic Soft Errors; conference report; Logic Soft Errors; conference report;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.91
  • Filename
    1683710
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1165170