• DocumentCode
    1165560
  • Title

    New empirical nonlinear model for HEMT devices

  • Author

    Angelov, Iltcho ; Zirath, Herbert

  • Author_Institution
    Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    28
  • Issue
    2
  • fYear
    1992
  • Firstpage
    140
  • Lastpage
    142
  • Abstract
    A new large signal model for HEMTs, capable of modelling the current-voltage characteristic and its derivatives, including the characteristic transconductance peak, is described. Model parameter extraction is straightforward and is made for a submicrometre gatelength delta -doped pseudomorphic HEMT. Measured and modelled DC and S-parameters are compared.
  • Keywords
    S-parameters; high electron mobility transistors; semiconductor device models; DC parameters; HEMT devices; I/V characteristics; S-parameters; characteristic transconductance peak; current-voltage characteristic; delta doped type; large signal model; model parameter extraction; nonlinear model; pseudomorphic HEMT; submicrometre gatelength; submicron gate;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19920087
  • Filename
    118931