Title :
Simple analytical model for power DMOS transistors
Author :
Kuivalainen, P. ; Ronkainen, H.
Author_Institution :
Semicond. Lab., Tech. Res. Centre of Finland, Espoo, Finland
Abstract :
A simple analytical DC model has been developed for power DMOS transistors in a strong inversion. The model takes into account some special features of the new short channel DMOSTs such as local heating effects, a large voltage drop in the drift region and a mobility degradation at large drain source voltages. The model provides a good agreement with the measured data even when only a small number of fitting parameters are used.
Keywords :
insulated gate field effect transistors; power transistors; semiconductor device models; DC model; analytical model; fitting parameters; local heating effects; mobility degradation; power DMOS transistors; strong inversion; voltage drop;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19920116