DocumentCode :
1166755
Title :
Metallographic Study of Dual Type Current Limiting Fuse Element
Author :
Tanaka, T. ; Momoshima, H. ; Takaoka, N. ; Fguchi, I. ; Watanabe, A. ; Sekine, C.
Author_Institution :
Takamatsu Electric Works, Ltd.
Issue :
6
fYear :
1982
fDate :
6/1/1982 12:00:00 AM
Firstpage :
1768
Lastpage :
1775
Abstract :
A newly developed dual-element current-limiting fuse with full protection capability has fuse element consisting of two sorts of metals, i. e. gold-silicon eutectic alloy wire and silver wire being connected in series. The results of the metallographic study is reported on the process of deterioration of fuse element caused by repetition of over-current using high temperature microscope, an electron probe microanalyzer and a regular optical microscope. It is clarified (1) that fusing of the dual-type current-limiting fuse element does not occur at the silver wire section but always at the gold-silicon eutectic alloy wire, and (2) that fine gold-silicon eutectic structure is unifomly distributed in gold primary crystal even after the repetition of over-current and the eutectic structure is stable up to the melting point.
Keywords :
Current limiters; Electron microscopy; Fuses; Gold alloys; Optical microscopy; Probes; Protection; Silver; Temperature; Wire;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/TPAS.1982.317230
Filename :
4111517
Link To Document :
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