• DocumentCode
    1171358
  • Title

    Trade-offs in cycle time management: hot lots

  • Author

    Ehteshami, Babak ; Pétrakian, Raja G. ; Shabe, Phyllis M.

  • Author_Institution
    Altera Corp., San Jose, CA, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1992
  • fDate
    5/1/1992 12:00:00 AM
  • Firstpage
    101
  • Lastpage
    106
  • Abstract
    In manufacturing, higher priority is given to hot lots to reduce their cycle time. The impact of hot lots on the cycle time of other lots in the system is studied here. Object-oriented simulation experiments of a wafer fabrication model were run to investigate the above impact. The simulation results showed that as the proportion of hot lots in the work-in progress increases, both the average cycle time and the corresponding standard deviation for all other lots increase dramatically. Thus, it is argued that hot lots induce either a deterioration in service level for regular lots or an increase in inventory costs. Sound management accounting would require that these costs be estimated, possibly using an approach outlined here
  • Keywords
    integrated circuit manufacture; production control; scheduling; average cycle time; batch processing; cycle time management; cycle time of other lots; deterioration in service level; hot lots; inventory costs; management accounting; object oriented simulation experiments; priority lots; simulation results; standard deviation; wafer fabrication model; work-in progress; Batch production systems; Costs; Fabrication; Management accounting; Manufacturing; Object oriented modeling; Production facilities; Semiconductor device modeling; Shape; Workstations;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.136270
  • Filename
    136270