Title :
Wireless, ESL, DFM, and Power on Stage at 42nd DAC
Author_Institution :
Technical Program Committee cochair, DAC 2005
Abstract :
The 42nd Design Automation Conference, the world\´s leading conference and exhibition for design automation, took place in Anaheim, California, from 13 to 17 June 2005. This year\´s DAC featured a special industry theme day, "Wireless Wednesday," and two keynote talks, by Bernard Meyerson of IBM and Ron Rohrer of Cadence. The technical program explored front-end design issues at the electronic system level (ESL), and various topics linking design and manufacturing. DAC 2006 will take place in San Francisco, California, from 24 to 28 July 2006.
Keywords :
DAC 2005; DAC 2006; EDA; SoC design; electronic system level (ESL) design; wireless; Automatic testing; Circuit testing; Design for manufacture; Electronic design automation and methodology; Electronic equipment testing; Embedded software; Integrated circuit testing; Logic testing; Software testing; System testing; DAC 2005; DAC 2006; EDA; SoC design; electronic system level (ESL) design; wireless;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2005.122
