DocumentCode :
1174174
Title :
High-power recessed-gate AlGaN-GaN HFET with a field-modulating plate
Author :
Okamoto, Yasuhiro ; Ando, Yuji ; Nakayama, Tatsuo ; Hataya, Koji ; Miyamoto, Hironobu ; Inoue, Takashi ; Senda, Masanobu ; Hirata, Koji ; Kosaki, Masayoshi ; Shibata, Naoki ; Kuzuhara, Masaaki
Author_Institution :
NEC Corp., Kawasaki, Japan
Volume :
51
Issue :
12
fYear :
2004
Firstpage :
2217
Lastpage :
2222
Abstract :
Recessed-gate AlGaN-GaN heterojunction field-effect transistors (FETs) with a field-modulating plate (FP) have been successfully fabricated for high-voltage and high-power microwave applications. The developed recessed-gate FP-FET with a gate length of 1 μm exhibited an increased transconductance of 200 mS/mm. A series of current collapse measurements revealed that the recessed-gate FP-FET is highly desirable for collapse-free high-voltage power operation. Equivalent circuit analysis demonstrated that the gain loss due to the additional gate feedback capacitance associated with the FP electrode is considerably compensated by increasing the drain bias voltage to more than 30 V. A 48-mm-wide recessed-gate FP-FET biased at a drain voltage of 48 V exhibited a record saturated output power of 197 W with a linear gain of 10.1 dB and a power-added efficiency of 67% at 2 GHz.
Keywords :
III-V semiconductors; aluminium compounds; equivalent circuits; field effect transistors; gallium compounds; 197 W; 2 GHz; 48 V; 48 mm; AlGaN-GaN; FP electrode; current collapse measurements; drain bias voltage; equivalent circuit analysis; field-modulating plate; gain loss; gate feedback capacitance; heterojunction field-effect transistors; power operation; recessed-gate AlGaN-GaN HFET; transconductance; Aluminum gallium nitride; Current measurement; Equivalent circuits; FETs; HEMTs; Heterojunctions; MODFETs; Power measurement; Transconductance; Voltage; 65; FET; FP; Field-effect transistors; GaN; field-modulating plate; recess;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2004.838453
Filename :
1362991
Link To Document :
بازگشت