Title :
Fault detection in CMOS circuits by consumption measurement
Author :
Jacomino, Mireille ; Rainard, Jean-Luc ; David, René
Author_Institution :
Lab. d´´Autom. de Grenoble, Saint-Martin d´´Heres, France
fDate :
6/1/1989 12:00:00 AM
Abstract :
Some testing problems in CMOS circuits are presented, including stuck-open and stuck-on faults, bridging faults, and excessive leakage in dynamic CMOS circuits. It is shown that the current consumption of a faulty CMOS circuit is several orders of magnitude greater than that of the fault-free circuit: hence, consumption measurement may be a suitable way of testing. Test by consumption measurement provides improved controllability and observability of some faults in comparison with the logic test
Keywords :
CMOS integrated circuits; electric current measurement; fault location; integrated circuit testing; leakage currents; CMOS circuits; IC testing; bridging faults; consumption measurement; controllability; current consumption; dynamic CMOS; fault detection; leakage; observability; stuck-on faults; stuck-open fault; testing; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Current measurement; Electrical fault detection; Logic testing; MOS devices; Variable structure systems; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
