Title :
Design and analysis of compact dictionaries for diagnosis in scan-BIST
Author :
Liu, Chunsheng ; Chakrabarty, Krishnendu
Author_Institution :
Dept. of Comput. & Electron. Eng., Univ. of Nebraska-Lincoln, Omaha, USA
Abstract :
We present a new technique for generating compact dictionaries for cause-effect diagnosis in scan-BIST. This approach relies on the use of three compact dictionaries and target both modeled and unmodeled faults. We present analytical results that provide useful guidelines for the design of these compact dictionaries. We also present experimental results for the larger ISCAS-89 benchmark circuits for the diagnosis of various types of unmodeled faults.
Keywords :
benchmark testing; built-in self test; fault diagnosis; logic testing; shift registers; ISCAS-89 benchmark circuit; LFSR; cause-effect diagnosis; compact dictionary; diagnostic resolution; fault diagnosis; interval-based dictionary; linear feedback shift register; scan-BIST; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Dictionaries; Fault diagnosis; Guidelines; Linear feedback shift registers; Very large scale integration; Compaction; diagnostic resolution; fault diagnosis; interval-based dictionary; linear feedback shift register (LFSR);
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2005.853624
