Title :
Schematic array models for associative and non-associative memory circuits
Author :
Bose, Soumitra ; Nandi, Amit
Author_Institution :
Test Technol. Group, Intel Corp., Folsom, CA, USA
Abstract :
The modeling and simulation of memory circuits remains an outstanding problem whenever accuracy with respect to the actual schematic implementation is desired. Functionally equivalent Register Transfer (RT) level models often cannot be used for designs with embedded memory blocks, because schematic models for the surrounding logic may be required for fault-modeling accuracy. Existing methods derive a latch model that essentially represents each memory location as a latch primitive. This approach results in models that have a large number of primitives. We present new algorithms that model such circuits as decoded arrays that access entire rows of cells for individual read and write operations. Decoded array models are easy to generate and allow fault-modeling accuracy for the surrounding logic, including the memory address decoder. Experimental data show improvements of an order of magnitude for both logic and fault simulations, when compared to the equivalent latch model.
Keywords :
circuit simulation; content-addressable storage; fault simulation; integrated circuit modelling; logic simulation; semiconductor storage; associative memory circuits; decoded array models; embedded memory blocks; fault modeling; fault simulation; logic simulation; memory address decoder; nonassociative memory circuits; schematic array models; switch-level modeling; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Decoding; Equations; Formal verification; Latches; Logic arrays; Logic testing; Fault simulation; logic simulation; switch-level modeling;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2005.852051