Multiple dielectric structures to eliminate moding problems in conductor-backed coplanar waveguide MIC´

Author

Magerko, Mark A. ; Fan, Lu ; Chang, Kai

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

Volume

2

Issue

6

fYear

1992

fDate

6/1/1992 12:00:00 AM

Firstpage

257

Lastpage

259

Abstract

A conventional conductor-backed (grounded) coplanar waveguide (CBCPW) leaks energy from its dominant mode in the form of a parallel plate mode in the substrate region at all frequencies which can generate undesirable coupling effects and produce an ineffective circuit. A multiple dielectric structure with appropriate dimensions is used to suppress the leakage effects and the spectral domain method (SDM) predicts the critical frequency (transition point for leaky and nonleaky modes) for the waveguide. Experimental data verify this procedure and demonstrate the significance of the moding (leakage coupling) problems.<>

Keywords

dielectric thin films; microwave integrated circuits; waveguides; conductor-backed coplanar waveguide; critical frequency; leakage coupling; leakage suppression; leaky modes; microwave IC; moding problems; multiple dielectric structure; nonleaky modes; parallel plate mode; spectral domain method; Conductors; Coplanar waveguides; Coupling circuits; Cutoff frequency; Dielectric measurements; Dielectric substrates; Integrated circuit measurements; Microstrip; Microwave integrated circuits; Waveguide transitions;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.136525

Filename

136525