Title :
Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects
Author :
Kuo, Andy ; Rosales, Roberto ; Farahmand, Touraj ; Tabatabaei, Sassan ; Ivanov, Andre
Author_Institution :
Syst. on a Chip, Univ. of British Columbia, Vancouver, BC, Canada
Abstract :
Bounded uncorrelated jitter (BUJ), a subcomponent of total jitter, is commonly caused by crosstalk coupling from adjacent interconnects on printed circuit boards (PCB). However, the characteristics of BUJ are still not well understood. Neither a mathematical model of jitter, nor an algorithm to generate histograms for BUJ has been developed to this date. Such a model and algorithm would empower designers to predict BUJ to achieve total jitter budget without lengthy simulations and measurements. In this paper, we first review the characteristics of a crosstalk pulse induced by an aggressor signal on a quiet trace. Then, by applying the superposition principle, a jitter model to calculate the time difference between the distortion-free and the distorted edge crossings of the victim signal was developed. This model is also extended to calculate the worst case timing difference, BUJp-p. In addition, an algorithm to generate the histogram distribution of BUJ is also developed. The developed algorithm has fast execution times of 10-20 s, compared to simulation and measurement times of 10-30 min.
Keywords :
crosstalk; integrated circuit interconnections; jitter; printed circuits; 10 to 20 s; BUJ; PCB; bounded uncorrelated jitter; crosstalk coupling; deterministic jitter; distorted edge crossing; distortion-free crossing; high-speed interconnects; histogram distribution; jitter measurement method; mathematical model; printed circuit board; superposition principle; Algorithm design and analysis; Coupling circuits; Crosstalk; Distortion; Histograms; Integrated circuit interconnections; Jitter; Mathematical model; Predictive models; Printed circuits; Bounded uncorrelated jitter (BUJ); crosstalk; deterministic jitter; high-speed interconnects; jitter; jitter measurement methods;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.855101