DocumentCode :
1182889
Title :
HV impulse measuring systems analysis and qualification by estimation of measurement errors via FFT, convolution, and IFFT
Author :
Matyas, Zdenek ; Aro, Martti
Author_Institution :
Power Syst. & High-Voltage Eng., Helsinki Univ. of Technol., Espoo, Finland
Volume :
54
Issue :
5
fYear :
2005
Firstpage :
2013
Lastpage :
2019
Abstract :
Quality of high-voltage (HV) impulse measurements requires adequate dynamic performance of measuring systems (MS) with respect to the waveforms to be measured. Qualification of MSs for various impulses is a prerequisite for repeatability and reproducibility of HV testing results. Alternative qualification procedures are considered with respect to the standard full lightning impulse including evaluation of significance of its frequency components. Duality of step responses and amplitude-frequency responses is described in detailed examples. Special attention is paid to creeping, encountered with some converting devices. Variations of MS response parameters can lead to improper conclusions when only conventional examination of the dynamic behavior is used. Evaluation of the response parameters is an unnecessary step, which brings additional errors to the HV measurements. The paper is pointing out advantages and practical achievements of the frequency-domain qualification of dynamic properties based on the step response data obtained both experimentally and analytically. Measurement errors of the impulse peak value and time parameters have been evaluated via fast Fourier transform (FFT), convolution, and inverse discrete Fourier transform (IFFT) for a commercial divider. Direct determination of the HV impulse measurement range, no need for any additional parameters, and illustrative graphical presentation of results are the main advantages of this approach. Limitations of different qualification approaches are discussed.
Keywords :
convolution; fast Fourier transforms; frequency response; frequency-domain analysis; high-voltage techniques; impulse testing; measurement errors; qualifications; step response; voltage measurement; FFT; HV impulse measuring systems; HV testing; IFFT; amplitude-frequency responses; commercial divider; converting devices; convolution method; creeping; dynamic properties; fast Fourier transform; frequency-domain analysis; frequency-domain qualification; high-voltage impulse measurements; inverse discrete Fourier transform; lightning impulse; measurement errors; measurement quality; step responses; Convolution; Estimation error; Fast Fourier transforms; Frequency domain analysis; Impulse testing; Lightning; Measurement errors; Pulse measurements; Qualifications; Reproducibility of results; Convolution; discrete Fourier transform (DFT); fast Fourier transform (FFT); frequency-domain analysis; high-voltage (HV) measurement quality; inverse discrete Fourier transform (IFFT);
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2005.853674
Filename :
1514657
Link To Document :
بازگشت