DocumentCode :
1184049
Title :
Stability of morphotropic <110> oriented 0.65PMN-0.35PT single crystals
Author :
Sébald, Gaël ; Lebrun, Laurent ; Guyomar, Daniel
Author_Institution :
Lab. of Electr. Eng., Insa de Lyon, Villeurbanne, France
Volume :
51
Issue :
11
fYear :
2004
Firstpage :
1491
Lastpage :
1498
Abstract :
Electromechanical properties of (1-x)Pb (Mg/sub 1/3/Nb/sub 2/3/)O/sub 3-x/PbTiO/sub 3/ (PMN-PT) single crystals with x=0.35 were investigated as a function of different external disturbances. The polarization dependence on the electromechanical properties was first studied in order to determine the best polarization path. The correlation with X-ray measured phase ratio is presented and shows that the maximum of electromechanical properties may be correlated with a minimum rhombohedral/tetragonal phase ratio. Temperature, stress, electric field, and time (aging) stability was studied in order to determine performance-limiting factors of these materials. The rhombohedral/tetragonal phase transition is observed on temperature (80/spl deg/C), inducing a decrease of the electromechanical coupling factor (from 85% to 50%); but the whole properties are recovered while returning to room temperature. Stress measurement shows a large depoling of sample for stresses above 30 MPa. The PMN-PT single crystals were found to be surprisingly stable during aging, except for mechanical and dielectric losses. The same tendency was found on alternating current (AC) electric field dependence.
Keywords :
ageing; crystal orientation; dielectric losses; dielectric polarisation; internal stresses; lead compounds; piezoelectric materials; piezoelectricity; solid-state phase transformations; 293 to 298 K; Pb (Mg/sub 0.33/Nb/sub 0.66/)O/sub 3-x/-PbTiO/sub 3/; X-ray measured phase ratio; aging; alternating current electric field dependence; dielectric losses; dielectric polarization dependence; electromechanical coupling factor; electromechanical properties; morphotropic composition; rhombohedral-tetragonal phase transition; room temperature; single crystal; stress measurement; time stability; Aging; Crystals; Dielectric losses; Electric fields; Niobium; Phase measurement; Polarization; Stability; Stress measurement; Temperature;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2004.1367490
Filename :
1367490
Link To Document :
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