• DocumentCode
    118640
  • Title

    Study on the influencing factors of thermal spreading resistance of HP-LED package

  • Author

    Jinlong Zhang ; Luqiao Yin ; Peng Song ; Yang Bai ; Jianhua Zhang

  • Author_Institution
    Sch. of Mechatron. & Autom., Shanghai Univ., Shanghai, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    806
  • Lastpage
    810
  • Abstract
    The optical performance and reliability of High power light emitting diode (HP-LED) devices can be affected by the junction temperature, while thermal resistance is one of the main factors which influence the p-n junction temperature, especially for the thermal spreading resistance. So, Thermal analysis was conducted by differential structure functions combining with finite element analysis and calculation of thermal spreading resistance of HP-LED devices. The results show that thermal spreading resistance plays an important role on total thermal resistance of LED devices. The thermal spreading resistance shows a declined and then increased trend with the increase of substrate thickness; the contact area between the heating source and substrate is the main factor which influences thermal spreading resistance; It is beneficial to decrease the thermal spreading resistance when contact area ratio be increased. Thermal-convection resistance becomes the main factor that influences total thermal resistance of HP-LED devices with the changing of substrate bottom area, while the influence of thermal spreading resistance is weak. The eccentric distance between chip and substrate plays a distinct impact on thermal spreading resistance and junction temperature. The results of finite element simulation are in good agreement with calculation of thermal spreading resistance.
  • Keywords
    convection; electronics packaging; finite element analysis; light emitting diodes; p-n junctions; thermal resistance; wetting; HP-LED package; contact area ratio; differential structure function; eccentric distance; finite element analysis; high power light emitting diode device; optical performance; p-n junction temperature; reliability; resistance heating source; thermal resistance; thermal spreading resistance; thermal-convection resistance; Electronic packaging thermal management; Light emitting diodes; Resistance heating; Substrates; Thermal factors; Thermal resistance; HP-LED; contact area ratio; eccentric distance; substrate thickness; thermal spreading resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922771
  • Filename
    6922771