Title :
Performance-Aware Corner Model for Design for Manufacturing
Author :
Lin, Chung-Hsun ; Dunga, Mohan V. ; Lu, Darsen D. ; Niknejad, Ali M. ; Hu, Chenming
Author_Institution :
T.J. Watson Res. Center, IBM, Yorktown Heights, NY
fDate :
4/1/2009 12:00:00 AM
Abstract :
We present a methodology to generate performance-aware corner models (PAMs). Accuracy is improved by emphasizing electrical variation data and reconciling the process and electrical variation data. PAM supports corner (plusmnsigma and plusmn 2sigma) simulation and Monte Carlo simulation. Furthermore, PAM supports the practice of application-specific corner cards, for example, for gain-sensitive applications.
Keywords :
Monte Carlo methods; design for manufacture; integrated circuit design; integrated circuit manufacture; Monte Carlo simulation; application-specific corner card; design for manufacturing; electrical variation data; performance-aware corner model; CMOS technology; Circuit optimization; Circuit simulation; Monte Carlo methods; Predictive models; Principal component analysis; SPICE; Semiconductor device modeling; Very large scale integration; Virtual manufacturing; Compact model; Monte Carlo (MC); corner model; variations;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2008.2011845
