DocumentCode :
1186686
Title :
InSb Quantum-Well-Based Micro-Hall Devices: Potential for pT Detectivity
Author :
Kunets, Vasyl P. ; Easwaran, Saptharishi ; Black, William T. ; Guzun, Dorel ; Mazur, Yuriy I. ; Goel, Niti ; Mishima, Tetsuya D. ; Santos, Michael B. ; Salamo, Gregory J.
Author_Institution :
Dept. of Phys., Univ. of Arkansas, Fayetteville, AR
Volume :
56
Issue :
4
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
683
Lastpage :
687
Abstract :
A series of high-mobility Al0.12In0.88Sb/InSb heterostructures were grown by molecular beam epitaxy to investigate the fabrication of micro-Hall magnetic field sensors. By applying remote delta-doping of different densities to control the 2-D electron density in the quantum channel, as well as scattering mechanisms, the detection limit of the micro-Hall device was improved. The present studies show that micro-Hall devices 35 mum wide have the ability to detect a magnetic field of 25 nT at 300 K and 11 nT at 80 K operating at a frequency of 10 kHz. Our results indicate that the use of devices with larger sizes, based on the same material system, will lead to magnetic field detection in the pT range at low temperatures and sub-nT range even at room temperature.
Keywords :
Hall effect devices; III-V semiconductors; aluminium compounds; indium compounds; magnetic sensors; molecular beam epitaxial growth; semiconductor quantum wells; 2-D electron density; Al0.12In0.88Sb-InSb; micro-Hall magnetic field sensors; molecular beam epitaxy; quantum-well-based micro-Hall devices; remote delta-doping; temperature 300 K; temperature 80 K; Electrons; Fabrication; Frequency; Magnetic fields; Magnetic materials; Magnetic sensors; Molecular beam epitaxial growth; Particle scattering; Quantum well devices; Temperature distribution; $hbox{In}_{0.12}hbox{Al}_{0.88}hbox{Sb}$; InSb; magnetic sensitivity; micro-Hall effect devices; narrow band gap semiconductor material; noise; quantum well;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2009.2014187
Filename :
4798213
Link To Document :
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