Title :
Analog Fault Diagnosis with Failure Bounds
Author :
Wu, Chwan-chia ; Nakajima, Kazug ; Wey, Chin-Long ; Saeks, Richard
fDate :
5/1/1982 12:00:00 AM
Abstract :
A simulation-after-test algorithm for the analog fault diagnosis problem is proposed in which a bound on the maximum number of simultaneous failures is used to minimize the number of test points required. The resultant algorithm is applicable to both linear and nonlinear systems with multiple hard or soft faults and can be used to isolate failures up to an arbitrarily specified "replaceable chip or subsystem."
Keywords :
Analog system testing; Nonlinear networks and systems; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Equations; Fault diagnosis; Nonlinear systems; System testing; Vectors;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1982.1085154
