• DocumentCode
    118776
  • Title

    The influence of imposed electric current on the tensile fracture behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu solder joints

  • Author

    Wang-Yun Li ; Hong-Bo Qin ; Min-Bo Zhou ; Xin-Ping Zhang

  • Author_Institution
    Sch. of Mater. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    1030
  • Lastpage
    1034
  • Abstract
    The fracture behavior of microscale lead-free Sn-3.0Ag-0.5Cu solder joints under electrotensile load was characterized, in comparison with those under pure tensile load. Experimental results show that under electrotensile load the stress-strain and strain-time curves of joints exhibit three distinct stages, i.e., the fast deformation stage at the beginning of loading, linear deformation stage and the accelerating fracture stage. No significant difference in strain feature between the electrotensile loaded joint and pure tensile loaded joint was observed. The solder joints under electrotensile loading and tensile loading exhibit the same fracture mechanism at the same thickness-to-diameter ratio of joints, while the fracture strength of solder joints under electrotensile load is decreased greatly compared with that under pure tensile load, even lower than that of the bulk solder. Moreover, the orientation of β-Sn grains may tend to rearrange along the direction of current stressing under electrotensile loading.
  • Keywords
    copper alloys; electric current; fracture toughness; silver alloys; solders; stress-strain relations; tensile strength; tin alloys; Sn-3.0Ag-0.5Cu; accelerating fracture stage; bulk solder; electrotensile loaded joint; fracture strength; imposed electric current; linear deformation stage; microscale lead-free solder joint; pure tensile loaded joint; strain-time curve; stress-strain curve; tensile fracture behavior; Copper; Current; Joints; Loading; Soldering; Strain; Stress; Electrotensile; Sn-3.0Ag-0.5Cu solder; fracture behavior; microscale solder joint;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922822
  • Filename
    6922822