Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs)

Author

Swift, Gary M. ; Rezgui, Sana ; George, Jeffrey ; Carmichael, Carl ; Napier, Matthew ; Maksymowicz, John ; Moore, Jason ; Lesea, Austin ; Koga, R. ; Wrobel, T.F.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

51

Issue

6

fYear

2004

Firstpage

3469

Lastpage

3474

Abstract

Heavy-ion irradiation and fault injection experiments were conducted to evaluate the upset sensitivity of the Xilinx Virtex-II field programmable gate arrays (FPGAs) input/output block (IOB). Full triple module redundancy (TMR) of the IOBs, in combination with regular configuration scrubbing, proved to be a quite effective upset mitigation method.

Keywords

dynamic testing; field programmable gate arrays; ion beam effects; redundancy; FPGA input/output blocks; Xilinx Virtex-II field programmable gate array; dynamic testing; effective upset mitigation method; fault injection experiments; heavy-ion irradiation; radiation effects; reconfigurable field programmable gate arrays; regular configuration scrubbing; single-event effects; triple module redundancy; upset sensitivity; Aerodynamics; Field programmable gate arrays; Laboratories; NASA; Propulsion; Radiation effects; Redundancy; Single event transient; Software tools; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2004.839190

Filename

1369512