Title :
Iterative Subspace Analysis Based on Feature Line Distance
Author :
Pang, Yanwei ; Yuan, Yuan ; Li, Xuelong
Author_Institution :
Sch. of Electron. Inf. Eng., Tianjin Univ., Tianjin
fDate :
4/1/2009 12:00:00 AM
Abstract :
Nearest feature line-based subspace analysis is first proposed in this paper. Compared with conventional methods, the newly proposed one brings better generalization performance and incremental analysis. The projection point and feature line distance are expressed as a function of a subspace, which is obtained by minimizing the mean square feature line distance. Moreover, by adopting stochastic approximation rule to minimize the objective function in a gradient manner, the new method can be performed in an incremental mode, which makes it working well upon future data. Experimental results on the FERET face database and the UCI satellite image database demonstrate the effectiveness.
Keywords :
image recognition; iterative methods; mean square error methods; stochastic processes; generalization performance; incremental analysis; iterative subspace analysis; mean square feature line distance; nearest feature line; objective function; projection point; stochastic approximation rule; Face recognition; Image analysis; Image databases; Interpolation; Linear discriminant analysis; Principal component analysis; Scattering; Stochastic processes; Tensile stress; Training data; Face recognition; feature line; subspace;
Journal_Title :
Image Processing, IEEE Transactions on
DOI :
10.1109/TIP.2008.2011167