• DocumentCode
    119063
  • Title

    Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests

  • Author

    Zhang, Grace G. ; Lu, Sophie L. Y. ; Yang, Nick G. M. ; Zou, Sam H. Y. ; Zhong, Steven D. L. ; Lo, Jeffery C. C. ; Lee, S. W. Ricky

  • Author_Institution
    HKUST LED-FPD Technol. R&D Center at Foshan, Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    1477
  • Lastpage
    1481
  • Abstract
    In this paper, a fully automated, low-cost, real-time illuminance measurement system for LED long term reliability tests is proposed. The system has only one photodetector to measure the illuminance of all samples inside the test chamber during the reliability test. With a proprietary algorithm, a single photodetector can measure the illuminance of all samples in the chamber by sequential scanning. This system monitors and records the illuminance of each individual sample inside the test chamber. This provides continuous and reliable data for analysis and prediction of LED lifespan. It does not require suspending the reliability test for sample inspection and can automatically analyze the time-to-failure of samples. The proposed system can significantly reduce the time required for data acquisition and measurement errors. This paper also compares the results obtained from the proposed system and the conventional periodic inspection to highlight the merits of the new system.
  • Keywords
    light emitting diodes; photodetectors; reliability; LED lifespan; LED long-term reliability test; data acquisition; fully-automated low-cost real-time illuminance measurement system; measurement errors; periodic inspection; photodetector; proprietary algorithm; real-time monitoring system development; sample inspection; sample time-to-failure; sequential scanning; test chamber; time reduction; uniphotodetector; Abstracts; Decision support systems; IEEE standards; Light emitting diodes; Photonics; Real-time systems; Reliability; LED; illuminance; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922933
  • Filename
    6922933