• DocumentCode
    1190902
  • Title

    R68-22 Current Status of Large Scale Integration Technology

  • Author

    Murrell, T.A.

  • Issue
    5
  • fYear
    1968
  • fDate
    5/1/1968 12:00:00 AM
  • Firstpage
    521
  • Lastpage
    522
  • Abstract
    This paper combines a useful review of progress during the past year, a description of present programs and immediate goals, and some forecasts of ultimate goals. Although the author, as director of Texas Instruments´ semiconductor research and development laboratories, deals primarily with programs and points of view at TI, he makes enough references to work at other companies to build up a reasonably comprehensive picture of the large-scale integration field. Four main areas are covered: bipolar chip technology, full-slice technology, MOS technology, and hybrid technology.
  • Keywords
    Circuit faults; Integrated circuit technology; Large scale integration; Logic arrays; Logic gates; Metallization; Programmable logic arrays; Redundancy; Shift registers; Wiring;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1968.226917
  • Filename
    1687387