DocumentCode :
1193159
Title :
Advances in high-Q piezoelectric resonator materials and devices
Author :
Ballato, Arthur ; Gualtieri, John G.
Author_Institution :
US Army Res. Lab. Electron. & Power Sources Directorate, Fort Monmouth, NJ, USA
Volume :
41
Issue :
6
fYear :
1994
Firstpage :
834
Lastpage :
844
Abstract :
In order to compare piezoelectric materials and devices, an intrinsic parameter, the motional time constant /spl tau//sub 1//sup (m/)=(/spl omega//sub m/Q/sub m/)/sup -1/ for a particular mode m is employed. The use of /spl tau//sub 1//sup (m/) follows from the accommodation of acoustic loss in the elastic compliance/stiffness and the establishment of material coefficients that are elements of viscosity matrices. Alternative and fully equivalent definitions of /spl tau//sub 1/ are given based on the RC time constant derived from the equivalent circuit representation of a crystal resonator, acoustic attenuation, logarithmic decrement, and viscosity or damping. For quartz devices, the variation of /spl tau//sub 1/: for any simple thickness mode, for the Y´X shear mode for rotated Y-cuts, and with diameter-thickness ratio for AT-cuts is discussed. Other factors such as mounting loss and loss caused by crystal inhomogeneities (dislocations, defect positions in the resonator, and impurity migration under vibrational stress) are briefly considered with quartz devices as the model. Some new piezoelectric materials/material constants/devices are reviewed and their motional time constants are compared. A physical parameter, composed of acoustic velocity, piezoelectric coupling, and /spl tau//sub 1/ is identified which aids in understanding the maximum frequency limitations of plate resonators.<>
Keywords :
Q-factor; acoustic resonators; crystal resonators; equivalent circuits; piezoelectric materials; quartz; surface acoustic wave devices; AT-cuts; RC time constant; SAW resonators; SiO; acoustic attenuation; acoustic loss; crystal inhomogeneities; crystal resonator; diameter-thickness ratio; elastic compliance/stiffness; equivalent circuit representation; high-Q piezoelectric resonator; logarithmic decrement; motional time constant; mounting loss; piezoelectric materials; plate resonators; quartz devices; resonator materials; rotated Y-cuts; shear mode; viscosity matrices; Acoustic devices; Acoustic materials; Attenuation; Crystalline materials; Damping; Equivalent circuits; Impurities; Piezoelectric devices; Piezoelectric materials; Viscosity;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.330264
Filename :
330264
Link To Document :
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