DocumentCode :
1193408
Title :
Vector magnetometry of synthetic spin valves
Author :
Rutsch, G. ; Yang, J. ; Van Drent, W. ; Mauri, D. ; Li, J.
Author_Institution :
Hitachi Global Storage Technol. Inc., San Jose, CA, USA
Volume :
41
Issue :
10
fYear :
2005
Firstpage :
3712
Lastpage :
3714
Abstract :
Vector magnetometry is applied to the detailed magnetic characterization of spin valve films. Algorithms are developed to analyze curves of in-plane vector magnetization in the presence of constant rotating magnetic fields. For fields sufficiently large compared to the free layer coupling filed, these methods lead to the accurate determination of the pinning axis, and the net pinned layer and free layer moments. Further analysis allows determination of the free layer magnetic torque and the magnitude and angle of its anisotropies. The range of validity and the accuracy of these methods is discussed.
Keywords :
magnetic anisotropy; magnetic field effects; magnetic thin films; magnetometers; spin valves; torque; free layer magnetic torque; giant magnetoresistance; in-plane vector magnetization; magnetic characterization; rotating magnetic fields; spin valve films; synthetic spin valves; torque magnetometry; vector magnetometry; Algorithm design and analysis; Anisotropic magnetoresistance; Magnetic analysis; Magnetic anisotropy; Magnetic fields; Magnetic films; Magnetization; Perpendicular magnetic anisotropy; Spin valves; Torque; Giant magnetoresistance; spin valve; torque magnetometry; vector magnetometry;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2005.854921
Filename :
1519420
Link To Document :
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