Title :
The frequency response of bipolar transistor noise figure
Author :
Moinian, Shahriar ; Choma, John, Jr.
fDate :
1/1/1986 12:00:00 AM
Abstract :
A detailed analysis of the dependence of bipolar transistor noise figure on signal frequency is undertaken. Theoretical results, which are validated by experiment, show that the net effective emitter resistance contributes significantly to low-frequency noise figure degradation. This resistance also reduces the corner frequency above which the noise figure degrades substantially with signal frequency.
Keywords :
Amplifier noise; Bipolar transistor amplifiers; Semiconductor device noise; Solid-state integrated circuits; Bipolar transistors; Circuit noise; Circuit synthesis; Degradation; Electric resistance; Frequency measurement; Frequency response; Low-frequency noise; Noise figure; Noise measurement;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1986.1085831
