DocumentCode :
1194636
Title :
An assessment of wide bandgap semiconductors for power devices
Author :
Hudgins, Jerry L. ; Simin, Grigory S. ; Santi, Enrico ; Khan, M.Asif
Author_Institution :
Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC, USA
Volume :
18
Issue :
3
fYear :
2003
fDate :
5/1/2003 12:00:00 AM
Firstpage :
907
Lastpage :
914
Abstract :
An advantage for some wide bandgap materials, that is often overlooked, is that the thermal coefficient of expansion (CTE) is better matched to the ceramics in use for packaging technology. It is shown that the optimal choice for uni-polar devices is clearly GaN. It is further shown that the future optimal choice for bipolar devices is C (diamond) owing to the large bandgap, high thermal conductivity, and large electron and hole mobilities. A new expression relating the critical electric field for breakdown in abrupt junctions to the material bandgap energy is derived and is further used to derive new expressions for specific on-resistance in power semiconductor devices. These new expressions are compared to the previous literature and the efficacy of specific power devices, such as heterojunction MOSFETs, using GaN are discussed.
Keywords :
III-V semiconductors; carrier mobility; diamond; electric breakdown; electric resistance; energy gap; gallium compounds; p-n heterojunctions; power MOSFET; power semiconductor devices; silicon compounds; thermal expansion; wide band gap semiconductors; C; GaN; SiC; abrupt junctions; breakdown; ceramics; critical electric field; diamond; electron mobilities; heterojunction MOSFET; high thermal conductivity; hole mobilities; large bandgap; material bandgap energy; on-resistance; packaging technology; power devices; power semiconductor devices; specific power devices; thermal coefficient of expansion; uni-polar devices; wide bandgap semiconductors; Ceramics; Charge carrier processes; Electron mobility; Gallium nitride; Photonic band gap; Semiconductor device packaging; Semiconductor materials; Thermal conductivity; Thermal expansion; Wide band gap semiconductors;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2003.810840
Filename :
1198071
Link To Document :
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